Microwave De-embedding: Chapter 3. Characterization and Modeling of High-Frequency Active Devices Oriented to High-Sensitivity Subsystems Design Book PDF, ePub eBook

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Book Descriptions:
An overview of topics is presented related to noise characterization and modeling of linear, active devices for microwave applications, as well as to advanced methodologies for low-noise design. A complete description of the most common noise measurement techniques, namely the Y-factor method and the cold source method, are provided, with particular attention being paid to practical aspects such as de-embedding the measurement at the device under test reference planes, possible sources of error, and uncertainty estimation. Noise modeling is approached from a well-established standpoint, based on the extraction of a small-signal equivalent circuit model; but also source pull-based techniques—both standard and advanced ones—are broadly illustrated. Finally, a comprehensive discussion on design of single- and multistage low-noise amplifiers is proposed, ranging from the most classical tools and methodologies, such as constant-gain and constant-noise circles, to novel graphical tools and more advanced concepts, such as global mismatch limits and noise measure.

Microwave De-embedding: Chapter 3. Characterization and Modeling of High-Frequency Active Devices Oriented to High-Sensitivity Subsystems Design by Ernesto Limiti, Walter Ciccognani, Sergio Colangeli

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